INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "MONITORING DEVICE AND MONITORING METHOD EXECUTED BY INFORMATION PROCESSING DEVICE"

GENEVA, Oct. 19 -- HITACHI HIGH-TECH CORPORATION (1-17-1 Toranomon, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/008750) for "MONITORING DEVICE AND MONITORING METHOD EXECUTED BY INFORMATION PROCESSING DEVICE" on Mar 10, 2025. With publication no. WO/2025/215984, the details related to the patent application was published on Oct 16, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO)...