INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "METHOD FOR DETERMINING PRESENCE OR ABSENCE OF ABNORMALITY IN LIQUID CHROMATOGRAPH MASS SPECTROMETRY DEVICE AND PROCESSING DEVICE"

GENEVA, Feb. 10 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/024745) for "METHOD FOR DETERMINING PRESENCE OR ABSENCE OF ABNORMALITY IN LIQUID CHROMATOGRAPH MASS SPECTROMETRY DEVICE, AND PROCESSING DEVICE" on Jul 10, 2025. With publication no. WO/2026/028758, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed...