INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "MEASUREMENT DEVICE, MEASUREMENT DATA UTILIZATION SYSTEM AND MEASUREMENT DATA ACQUISITION METHOD"

GENEVA, Sept. 16 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/008642) for "MEASUREMENT DEVICE, MEASUREMENT DATA UTILIZATION SYSTEM, AND MEASUREMENT DATA ACQUISITION METHOD" on Mar 07, 2024. With publication no. WO/2025/186970, the details related to the patent application was published on Sep 11, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Prope...