INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "LIGHT SOURCE INSPECTING DEVICE, AUTOMATED ANALYZING DEVICE AND LIGHT SOURCE INSPECTION METHOD"

GENEVA, Jan. 27 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/015002) for "LIGHT SOURCE INSPECTING DEVICE, AUTOMATED ANALYZING DEVICE, AND LIGHT SOURCE INSPECTION METHOD" on Apr 16, 2025. With publication no. WO/2026/018510, the details related to the patent application was published on Jan 22, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property...