INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "IMAGING METHOD, IMAGING DEVICE, AUTOMATED ANALYZING DEVICE AND POSITIONAL ADJUSTMENT METHOD FOR AUTOMATED ANALYZING DEVICE"

GENEVA, June 24 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/044172) for "IMAGING METHOD, IMAGING DEVICE, AUTOMATED ANALYZING DEVICE, AND POSITIONAL ADJUSTMENT METHOD FOR AUTOMATED ANALYZING DEVICE" on Dec 13, 2024. With publication no. WO/2025/127131, the details related to the patent application was published on Jun 19, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by th...