GENEVA, Feb. 3 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/000520) for "DEFECT INSPECTION DEVICE FOR SECONDARY BATTERY MEMBER, DEFECT INSPECTION SYSTEM, DEFECT INSPECTION PROGRAM, AND DEFECT INSPECTION METHOD" on Jan 12, 2024. With publication no. WO/2025/022688, the details related to the patent application was published on Jan 30, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is m...