INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "DEFECT CLASSIFICATION DEVICE AND DEFECT CLASSIFICATION METHOD"

GENEVA, Sept. 29 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/010514) for "DEFECT CLASSIFICATION DEVICE AND DEFECT CLASSIFICATION METHOD" on Mar 18, 2024. With publication no. WO/2025/196881, the details related to the patent application was published on Sep 25, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(...