GENEVA, Dec. 22 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/015434) for "AUTOMATIC ANALYSIS DEVICE AND NOISE DETECTION METHOD FOR AUTOMATIC ANALYSIS DEVICE" on Apr 21, 2025. With publication no. WO/2025/258229, the details related to the patent application was published on Dec 18, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organizatio...