INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "AUTOMATED ANALYZING DEVICE AND WASTE LIQUID UNIT CONTAMINATION DETERMINATION METHOD"

GENEVA, Aug. 18 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/045852) for "AUTOMATED ANALYZING DEVICE, AND WASTE LIQUID UNIT CONTAMINATION DETERMINATION METHOD" on Dec 25, 2024. With publication no. WO/2025/169633, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organizat...