INTERNATIONAL PATENT: HITACHI, LTD., 株式会社日立製作所 FILES APPLICATION FOR "VULNERABILITY ANALYSIS DEVICE AND VULNERABILITY ANALYSIS METHOD"

GENEVA, Dec. 1 -- HITACHI, LTD. (6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 株式会社日立製作所 (東京都千代田区丸の内一丁目６番６号) filed a patent application (PCT/JP2025/006420) for "VULNERABILITY ANALYSIS DEVICE AND VULNERABILITY ANALYSIS METHOD" on Feb 25, 2025. With publication no. WO/2025/243632, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MORITA, Nob...