INTERNATIONAL PATENT: HITACHI, LTD., 株式会社日立製作所 FILES APPLICATION FOR "REUSE DETERMINATION DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT, REUSE DETERMINATION SYSTEM AND REUSE DETERMINATION METHOD"

GENEVA, June 24 -- HITACHI, LTD. (6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 株式会社日立製作所 (東京都千代田区丸の内一丁目６番６号) filed a patent application (PCT/JP2024/029618) for "REUSE DETERMINATION DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT, REUSE DETERMINATION SYSTEM, AND REUSE DETERMINATION METHOD" on Aug 21, 2024. With publication no. WO/2025/126576, the details related to the patent application was published on Jun 19, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intelle...