GENEVA, Oct. 13 -- HITACHI, LTD. (6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 株式会社日立製作所 (東京都千代田区丸の内一丁目６番６号) filed a patent application (PCT/JP2024/013467) for "METHOD FOR INSPECTING ELEVATOR APPARATUS, AND DEVICE FOR INSPECTING ELEVATOR APPARATUS" on Apr 01, 2024. With publication no. WO/2025/210701, the details related to the patent application was published on Oct 09, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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