INTERNATIONAL PATENT: HITACHI, LTD., 株式会社日立製作所 FILES APPLICATION FOR "FAILURE DIAGNOSIS DEVICE, FAILURE DIAGNOSIS METHOD AND PROGRAM THEREOF"

GENEVA, March 9 -- HITACHI, LTD. (6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 株式会社日立製作所 (東京都千代田区丸の内一丁目６番６号) filed a patent application (PCT/JP2024/013578) for "FAILURE DIAGNOSIS DEVICE, FAILURE DIAGNOSIS METHOD, AND PROGRAM THEREOF" on Apr 02, 2024. With publication no. WO/2025/046964, the details related to the patent application was published on Mar 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NI...