INTERNATIONAL PATENT: HIOKI E.E. CORPORATION, 日置電機株式会社 FILES APPLICATION FOR "FIRST MEASUREMENT DEVICE, SECOND MEASUREMENT DEVICE, MEASUREMENT SYSTEM AND MEASUREMENT METHOD"

GENEVA, Feb. 3 -- HIOKI E.E. CORPORATION (81, Koizumi, Ueda-shi, Nagano3861192), 日置電機株式会社 (長野県上田市小泉８１番地) filed a patent application (PCT/JP2024/016868) for "FIRST MEASUREMENT DEVICE, SECOND MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD" on May 02, 2024. With publication no. WO/2025/022754, the details related to the patent application was published on Jan 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KONDO, Hideharu (c/o HIOKI E.E....