INTERNATIONAL PATENT: HIDEEP, INC., 주식회사 하이딥 FILES APPLICATION FOR "TEST DEVICE AND TEST METHOD"

GENEVA, Nov. 11 -- HIDEEP, INC. (10F DTC Tower, 49, Daewangpangyo-ro 644beon-gil,Bundang-gu, Seongnam-si,Gyeonggi-do 13493), 주식회사 하이딥 (경기도성남시 분당구대왕판교로644번길 49, DTC Tower 10층) filed a patent application (PCT/KR2025/005803) for "TEST DEVICE AND TEST METHOD" on Apr 29, 2025. With publication no. WO/2025/230285, the details related to the patent application was published on Nov 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): M...