INTERNATIONAL PATENT: HEXAGON METROLOGY, INC. FILES APPLICATION FOR "MEASUREMENT PROBE HEAD IDENTIFICATION"

GENEVA, Aug. 19 -- HEXAGON METROLOGY, INC. (250 Circuit DriveNorth Kingstown, RI 02852) filed a patent application (PCT/US2025/013369) for "MEASUREMENT PROBE HEAD IDENTIFICATION" on Jan 28, 2025. With publication no. WO/2025/170791, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LINDNER, Ingo (Siegmund-hiepe-str. 2-1235578 Wetzlar), KOCIC, Milan (641 East AvenuePawtucket, RI 02860)

Abstract: A measurement probe identification system for a coordinate measurement machine may include a measurement probe configured to mea...