INTERNATIONAL PATENT: HANWHA SOLUTIONS CORPORATION, 한화솔루션 주식회사 FILES APPLICATION FOR "DEEP LEARNING-BASED PHOTOVOLTAIC PANEL DEFECT DETECTION DEVICE AND METHOD THEREFOR"

GENEVA, April 29 -- HANWHA SOLUTIONS CORPORATION (86 Cheonggyecheon-ro,Jung-gu,Seoul 04541), 한화솔루션 주식회사 (서울특별시중구청계천로 86) filed a patent application (PCT/KR2024/015707) for "DEEP LEARNING-BASED PHOTOVOLTAIC PANEL DEFECT DETECTION DEVICE, AND METHOD THEREFOR" on Oct 16, 2024. With publication no. WO/2025/084786, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LEE, Hyu Sung (86 Cheonggye...