GENEVA, Oct. 5 -- HANWHA SEMITECH CO., LTD. (84, Jeongdong-roSeongsan-gu, Changwon-si,Gyeongsangnam-do 51552), 한화세미텍 주식회사 (경상남도창원시 성산구정동로 84) filed a patent application (PCT/KR2025/002204) for "METHOD AND APPARATUS FOR MANAGING FACILITY PARAMETER" on Feb 14, 2025. With publication no. WO/2025/206583, the details related to the patent application was published on Oct 02, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): DO, Woo Young (84, Jeon...