INTERNATIONAL PATENT: HALLERBACH, BERND FILES APPLICATION FOR "METHOD FOR MEASURING SKIN PARAMETERS FOR ANALYZING SKIN NEEDS"

GENEVA, Jan. 4 -- HALLERBACH, Bernd (Rummler 2248324 Sendenhorst) filed a patent application (PCT/DE2025/000069) for "METHOD FOR MEASURING SKIN PARAMETERS FOR ANALYZING SKIN NEEDS" on Jun 23, 2025. With publication no. WO/2026/002317, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DETERS, Norbert (Am Alten Bahnhof 3545481 Mulheim)

Abstract: The invention relates to a method for measuring skin parameters for analyzing skin needs by means of at least one measuring device (19, 20), in which the skin type of a consumer (16)...