INTERNATIONAL PATENT: GOOIL SOLUTION CO., LTD., (주)지아이에스 FILES APPLICATION FOR "WAFER VIA HOLE INSPECTION METHOD USING DEEP LEARNING"

GENEVA, May 6 -- GOOIL SOLUTION CO., LTD. (55, 5gongdan 5-ro, Sandong-eupGumi-siGyeongsangbuk-do 39158), (주)지아이에스 (경상북도구미시산동읍 5공단5로 55) filed a patent application (PCT/KR2024/015507) for "WAFER VIA HOLE INSPECTION METHOD USING DEEP LEARNING" on Oct 14, 2024. With publication no. WO/2025/089688, the details related to the patent application was published on May 01, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LEE, Jae Yeol (102-1405, 130, Chimsannam-roBuk-guD...