INTERNATIONAL PATENT: GLOBALWAFERS CO., LTD. FILES APPLICATION FOR "SYSTEMS AND METHODS FOR NOISY IMAGE FEATURE IDENTIFICATION FOR TURBULENT LIQUID SURFACES"

GENEVA, Jan. 20 -- GLOBALWAFERS CO., LTD. (No. 8, Industrial East Road 2Science-Based Industrial ParkHsinchu City, 30075) filed a patent application (PCT/US2025/036447) for "SYSTEMS AND METHODS FOR NOISY IMAGE FEATURE IDENTIFICATION FOR TURBULENT LIQUID SURFACES" on Jul 03, 2025. With publication no. WO/2026/015389, the details related to the patent application was published on Jan 15, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MEYER, Benjamin M. (c/o MEMC LLC501 Pearl DriveSt. Peters, Missouri 63376), LUTTER, William L. (c/o MEMC LLC501 Pearl DriveSt. Peters, Missouri 63376)

Abstract:...