INTERNATIONAL PATENT: GLOBALWAFERS CO., LTD. FILES APPLICATION FOR "RESISTIVITY MEASUREMENT OF SILICON MATERIAL USING FOUR POINT PROBES ON INDUSTRIAL ANTHROPOMORPHIC ROBOTS"

GENEVA, Jan. 20 -- GLOBALWAFERS CO., LTD. (No. 8, Industrial East Road 2Science-Based Industrial Park30075 Hsinchu City) filed a patent application (PCT/US2025/037225) for "RESISTIVITY MEASUREMENT OF SILICON MATERIAL USING FOUR POINT PROBES ON INDUSTRIAL ANTHROPOMORPHIC ROBOTS" on Jul 11, 2025. With publication no. WO/2026/015772, the details related to the patent application was published on Jan 15, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): RIGON, Enrico (c/o MEMC Electronic Materials S.p.A.Via Nazionale, 5939012 Merano (Bolzano)), CASALIN, Daniele (c/o MEMC Electronic Materials S.p.A...