INTERNATIONAL PATENT: GLOBALWAFERS CO., LTD., MELNIKOV, ANDREY FILES APPLICATION FOR "SYSTEMS AND METHODS FOR PHASE-SHIFT INTERFEROMETRY UTILIZING LOGARITHMIZED PROBABILITY DENSITY FIT OF PHASE SHIFT INTERFERENCE DATA"

GENEVA, Jan. 20 -- GLOBALWAFERS CO., LTD. (No. 8, Industrial East Road 2Science-Based Industrial ParkHsinchu City, 30075), MELNIKOV, Andrey (c/o MEMC LLC501 Pearl DriveSt. Peters, Missouri 63376) filed a patent application (PCT/US2025/037238) for "SYSTEMS AND METHODS FOR PHASE-SHIFT INTERFEROMETRY UTILIZING LOGARITHMIZED PROBABILITY DENSITY FIT OF PHASE SHIFT INTERFERENCE DATA" on Jul 11, 2025. With publication no. WO/2026/015778, the details related to the patent application was published on Jan 15, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ORSCHEL, Benno (c/o MEMC LLC501 Pearl DriveS...