INTERNATIONAL PATENT: GLOBALWAFERS CO., LTD FILES APPLICATION FOR "SYSTEMS AND METHODS FOR MODEL BASED LUMPED PARAMETER ESTIMATION OF AXIAL GRADIENTS IN MELT AND CRYSTAL AT THE GROWING INTERFACE"

GENEVA, Feb. 4 -- GLOBALWAFERS CO., LTD (No. 8, Industrial East Road 2Science-Based Industrial Park30075 Hsinchu City) filed a patent application (PCT/US2025/039210) for "SYSTEMS AND METHODS FOR MODEL BASED LUMPED PARAMETER ESTIMATION OF AXIAL GRADIENTS IN MELT AND CRYSTAL AT THE GROWING INTERFACE" on Jul 25, 2025. With publication no. WO/2026/025008, the details related to the patent application was published on Jan 29, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NEUBERT, Michael (c/o MEMC LLC501 Pearl DriveSt. Peters, Missouri 63376)

Abstract: A computer device includes at least one p...