INTERNATIONAL PATENT: FUTUREWEI TECHNOLOGIES, INC. FILES APPLICATION FOR "BEAM MANAGEMENT BASED ON EVENT TRIGGERED MEASUREMENT REPORTING"

GENEVA, Aug. 13 -- FUTUREWEI TECHNOLOGIES, INC. (15851 Dallas ParkwaySuite 650Addison, Texas 75001) filed a patent application (PCT/US2025/026892) for "BEAM MANAGEMENT BASED ON EVENT TRIGGERED MEASUREMENT REPORTING" on Apr 29, 2025. With publication no. WO/2025/166389, the details related to the patent application was published on Aug 07, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): XU, Kai (1009 Riva Ridge DriveGreat Falls, Virginia 22066), XIAO, Weimin (4880 Westhaven CourtHoffman Estates, Illinois 60010), RONG, Zhigang (13565 Silver Ivy Ln.San Diego, California 92129)

Abstract: Meth...