INTERNATIONAL PATENT: FUJITSU LIMITED, 富士通株式会社 FILES APPLICATION FOR "MEASUREMENT PROGRAM, MEASUREMENT METHOD AND MEASUREMENT DEVICE"

GENEVA, Sept. 29 -- FUJITSU LIMITED (1-1, Kamikodanaka 4-chome, Nakahara-ku, Kawasaki-shi, Kanagawa2118588), 富士通株式会社 (神奈川県川崎市中原区上小田中４丁目１番１号) filed a patent application (PCT/JP2024/011336) for "MEASUREMENT PROGRAM, MEASUREMENT METHOD, AND MEASUREMENT DEVICE" on Mar 22, 2024. With publication no. WO/2025/197086, the details related to the patent application was published on Sep 25, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organi...