INTERNATIONAL PATENT: FUJITSU LIMITED, 富士通株式会社 FILES APPLICATION FOR "LESION IDENTIFICATION METHOD AND LESION IDENTIFICATION PROGRAM"

GENEVA, July 20 -- FUJITSU LIMITED (1-1, Kamikodanaka 4-chome, Nakahara-ku, Kawasaki-shi, Kanagawa2118588), 富士通株式会社 (神奈川県川崎市中原区上小田中４丁目１番１号) filed a patent application (PCT/JP2024/000331) for "LESION IDENTIFICATION METHOD AND LESION IDENTIFICATION PROGRAM" on Jan 11, 2024. With publication no. WO/2025/150130, the details related to the patent application was published on Jul 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organiza...