INTERNATIONAL PATENT: FUJITSU GERMANY GMBH FILES APPLICATION FOR "A METHOD FOR DETECTION OF ANOMALIES IN AN IMAGE AND ANOMALY DETECTION SYSTEM"

GENEVA, Sept. 8 -- FUJITSU GERMANY GMBH (Mies-van-der-Rohe-Str. 880807 Munchen) filed a patent application (PCT/EP2024/055454) for "A METHOD FOR DETECTION OF ANOMALIES IN AN IMAGE AND ANOMALY DETECTION SYSTEM" on Mar 01, 2024. With publication no. WO/2025/180648, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SHULKIN, Dimitrij (c/o Fujitsu Technology Solutions GmbHMies-van-der-Rohe-StraBe 880807 Munchen), MAHAJAN, Shweta (c/o Fujitsu Technology Solutions GmbHMies-van-der-Rohe-Str. 880807 Munchen), NAUJECK, Marcel (c/o Fu...