INTERNATIONAL PATENT: FUJIFILM CORPORATION, 富士フイルム株式会社 FILES APPLICATION FOR "DEFECT DETECTION METHOD, DEFECT DETECTION DEVICE AND DEFECT DETECTION PROGRAM"

GENEVA, March 31 -- FUJIFILM CORPORATION (26-30, Nishiazabu 2-chome, Minato-ku, Tokyo1068620), 富士フイルム株式会社 (東京都港区西麻布２丁目２６番３０号) filed a patent application (PCT/JP2024/017797) for "DEFECT DETECTION METHOD, DEFECT DETECTION DEVICE, AND DEFECT DETECTION PROGRAM" on May 14, 2024. With publication no. WO/2025/062729, the details related to the patent application was published on Mar 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization ...