INTERNATIONAL PATENT: FREIE UNIVERSITAT BERLIN FILES APPLICATION FOR "SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPE (SSNOM) SYSTEM"

GENEVA, Aug. 18 -- FREIE UNIVERSITAT BERLIN (Kaiserswerther StraBe 16-1814195 Berlin) filed a patent application (PCT/EP2025/052969) for "SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPE (SSNOM) SYSTEM" on Feb 05, 2025. With publication no. WO/2025/168633, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SAKIYAMA, Yusuke (Weimarische StraBe 1510715 Berlin), HEBERLE, Joachim (Manuelaweg 914089 Berlin)

Abstract: Scattering-type scanning near-field optical microscope (sSNOM) which comprises: a sample holder configure...