INTERNATIONAL PATENT: FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E. V. FILES APPLICATION FOR "METHOD FOR MEASURING OR INSPECTING REFLECTIVE SURFACES BY MEANS OF DEFLECTOMETRY"

GENEVA, June 30 -- FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E. V. (Hansastr. 27c80686 Munchen) filed a patent application (PCT/EP2024/081143) for "METHOD FOR MEASURING OR INSPECTING REFLECTIVE SURFACES BY MEANS OF DEFLECTOMETRY" on Nov 05, 2024. With publication no. WO/2025/131398, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MEYER, Johannes (c/o Fraunhofer-Institut fur Optronik, Systemtechnik und BildauswertungFraunhoferstr. 176131 Karlsruhe)

Abstract: The invention relates to a method for me...