INTERNATIONAL PATENT: FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E. V. FILES APPLICATION FOR "METHOD FOR DETERMINING PROPERTIES OF A SEMICONDUCTOR LAYER STRUCTURE"

GENEVA, Jan. 5 -- FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E. V. (HansastraBe 27c80686 Munchen) filed a patent application (PCT/EP2025/068267) for "METHOD FOR DETERMINING PROPERTIES OF A SEMICONDUCTOR LAYER STRUCTURE" on Jun 27, 2025. With publication no. WO/2026/003275, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WORNHOR, Alexandra (c/o Fraunhofer-Institut fur Solare EnergiesystemeHeidenhofstr. 279110 Freiburg), VAHLMAN, Henri (c/o Fraunhofer-Institut fur Solare EnergiesystemeHeidenhofstr. 2791...