GENEVA, Nov. 10 -- FOSS ANALYTICAL A/S (Nils Foss Alle 13400 Hilleroed) filed a patent application (PCT/IB2025/053231) for "IMAGE-BASED INSPECTION DEVICE" on Mar 27, 2025. With publication no. WO/2025/229425, the details related to the patent application was published on Nov 06, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): HOJER SANDERS, Nicolai (c/o Foss Analytical A/SNils FOSS Alle 1DK-3400 Hilleroed), DREIER, Erik Schou (c/o FOSS Analytical A/SFoss Alle 1DK-3400 Hilleroed)
Abstract: Imaged Based Inspection Device An image-based inspection device (2) comprises a transparent portion (4)...