INTERNATIONAL PATENT: FI-NDT FILES APPLICATION FOR "SYSTEM FOR MEASURING THE THICKNESS OF A FIRST SURFACE LAYER OF A MULTILAYER STRUCTURE AND NON-DESTRUCTIVE MEASUREMENT METHOD THEREOF"

GENEVA, April 19 -- FI-NDT (Universite Gustave EiffelCampus de Nantes Allee des Ponts et ChausseesCS-500444344 Bouguenais Cedex) filed a patent application (PCT/EP2024/078436) for "SYSTEM FOR MEASURING THE THICKNESS OF A FIRST SURFACE LAYER OF A MULTILAYER STRUCTURE AND NON-DESTRUCTIVE MEASUREMENT METHOD THEREOF" on Oct 09, 2024. With publication no. WO/2025/078461, the details related to the patent application was published on Apr 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): IHAMOUTEN, Amine (11bis rue Rene Antoine de Reaumur49460 Montreuil-Juigne), SOURIOU, David (112 boulevard du M...