GENEVA, Sept. 21 -- EXAIL (34 rue de la Croix de Fer78100 SAINT-GERMAIN-EN-LAYE) filed a patent application (PCT/EP2025/056612) for "APPARATUS AND METHOD FOR CARRYING OUT REFLECTOMETRY THROUGH MEASUREMENT OF AN OPTICAL INTERFEROMETRIC NOISE SIGNAL" on Mar 11, 2025. With publication no. WO/2025/190937, the details related to the patent application was published on Sep 18, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): DUCLOUX, Eric (C/O EXAIL34 rue de la Croix de Fer78100 SAINT-GERMAIN-EN-LAYE)
Abstract:
The present invention relates to a method and apparatus (100) for carrying out reflec...