INTERNATIONAL PATENT: ETH ZURICH FILES APPLICATION FOR "METHOD FOR THE DETERMINATION OF CLEAVAGE SITES IN GENOMIC DNA CAUSED BY EXPOSURE TO A SITE DIRECTED NUCLEASE"

GENEVA, Nov. 17 -- ETH ZURICH (Raemistrasse 1018092 Zurich) filed a patent application (PCT/EP2025/062923) for "METHOD FOR THE DETERMINATION OF CLEAVAGE SITES IN GENOMIC DNA CAUSED BY EXPOSURE TO A SITE DIRECTED NUCLEASE" on May 12, 2025. With publication no. WO/2025/233535, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CORN, Jacob (c/o ETH ZurichRaemistrasse 1018092 Zurich), VAN DE VENN, Lilly (c/o ETH ZurichRaemistrasse 1018092 Zurich), YEH, Charles D (c/o ETH ZurichRaemistrasse 1018092 Zurich)

Abstract: The present ...