INTERNATIONAL PATENT: ESSILOR INTERNATIONAL FILES APPLICATION FOR "SYSTEM FOR DETERMINING A CHARACTERIZATION OF AT LEAST ONE PARAMETER OF AN EYE MODEL"

GENEVA, Jan. 26 -- ESSILOR INTERNATIONAL (147 rue de Paris94220 CHARENTON-LE-PONT) filed a patent application (PCT/EP2025/066635) for "SYSTEM FOR DETERMINING A CHARACTERIZATION OF AT LEAST ONE PARAMETER OF AN EYE MODEL" on Jun 13, 2025. With publication no. WO/2026/017335, the details related to the patent application was published on Jan 22, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MESTRE, Michael (C/O Essilor International 147 rue de Paris,94220 CHARENTON LE PONT), SVERDLIN, Julia (C/O Essilor International 147 rue de Paris,94220 CHARENTON LE PONT)

Abstract: A system (100) for dete...