INTERNATIONAL PATENT: ESSILOR INTERNATIONAL FILES APPLICATION FOR "METHOD FOR DETERMINING VALUES OF PARAMETERS OF AN OPTICAL SYSTEM"

GENEVA, July 1 -- ESSILOR INTERNATIONAL (147 rue de Paris94220 CHARENTON-LE-PONT) filed a patent application (PCT/EP2024/086903) for "METHOD FOR DETERMINING VALUES OF PARAMETERS OF AN OPTICAL SYSTEM" on Dec 17, 2024. With publication no. WO/2025/132434, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): FRICKER, Sebastien (C/O Essilor International147 rue de Paris94220 CHARENTON-LE-PONT), DIVO, Fabien (C/O Essilor International147 rue de Paris94220 CHARENTON-LE-PONT)

Abstract: Method for determining values of parameters o...