INTERNATIONAL PATENT: ESSILOR INTERNATIONAL FILES APPLICATION FOR "METHOD FOR CHARACTERIZING AT LEAST PART OF A LENS ELEMENT"

GENEVA, May 27 -- ESSILOR INTERNATIONAL (147 rue de Paris94220 CHARENTON LE PONT) filed a patent application (PCT/EP2024/082314) for "METHOD FOR CHARACTERIZING AT LEAST PART OF A LENS ELEMENT" on Nov 14, 2024. With publication no. WO/2025/104157, the details related to the patent application was published on May 22, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HUGONNEAUX, Patrick (147 RUE DE PARIS94220 CHARENTON LE PONT), GUILLOT, Matthieu (147 RUE DE PARIS94220 CHARENTON-LE-PONT), GACOIN, Eric (147 RUE DE PARIS94220 CHARENT LE PONT), CORNET, Marion (147 RUE DE PARIS94220 CHARENTON LE PON...