GENEVA, June 30 -- ESSILOR INTERNATIONAL (147 rue de Paris94220 CHARENTON-LE-PONT) filed a patent application (PCT/EP2024/082870) for "COMPENSATION MECHANISM FOR MEASURING AN IMAGE QUALITY PARAMETER FOR AN EYEPIECE" on Nov 19, 2024. With publication no. WO/2025/131504, the details related to the patent application was published on Jun 26, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): DIVO, Fabien (C/O Essilor International147 rue de Paris94220 CHARENTON-LE-PONT)
Abstract:
The disclosure relates to a system for obtaining an image quality parameter of an eyepiece suitable for being dispos...