INTERNATIONAL PATENT: EPICA INTERNATIONAL, INC. FILES APPLICATION FOR "SYSTEMS AND METHODS FOR DENOISING IMAGES RENDERED FROM SCAN DATA ACQUIRED BY COMPUTED TOMOGRAPHY"

GENEVA, Dec. 10 -- EPICA INTERNATIONAL, INC. (901 Calle AmanecerSuite 150San Clemente, California 92673) filed a patent application (PCT/US2025/030422) for "SYSTEMS AND METHODS FOR DENOISING IMAGES RENDERED FROM SCAN DATA ACQUIRED BY COMPUTED TOMOGRAPHY" on May 21, 2025. With publication no. WO/2025/250421, the details related to the patent application was published on Dec 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DENISOVA, Elena (Via Gabriele D'Annunzio, 159D50135 Florence), BOCCHI, Leonardo (c/o Imaginalis S.r.l.Via Rodolfo Morandi 13/15, Sesto Fiorentino50019 Florence)

Abstract...