GENEVA, May 12 -- EOSDX INC. (1455 Adams DriveMenlo Park, California 94025) filed a patent application (PCT/IB2024/059571) for "DIFFRACTOMETER-BASED GLOBAL DIAGNOSTIC SYSTEMS AND METHODS" on Sep 30, 2024. With publication no. WO/2025/093957, the details related to the patent application was published on May 08, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): LAZAREV, Alexander (1455 Adams DriveMenlo Park, California 94025), LAZAREV, Pavel (1455 Adams DriveMenlo Park, California 94025)
Abstract:
A method for diagnosing diseases in human patients can include providing a set of global X-ray ...