INTERNATIONAL PATENT: ENTANGLEMENT, INC. FILES APPLICATION FOR "CRITICAL NODE DETECTION"

GENEVA, Feb. 18 -- ENTANGLEMENT, INC. (40 Exchange PlaceSuite 610New York, New York 10005) filed a patent application (PCT/US2024/041046) for "CRITICAL NODE DETECTION" on Aug 06, 2024. With publication no. WO/2025/034710, the details related to the patent application was published on Feb 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WANG, Haibo (7615 Laguna Del Mar CourtUnit 169Laredo, Texas 78041)

Abstract: A computer-implemented method for optimizing neural networks by detecting critical and non-critical nodes is disclosed. The method involves obtaining a neural network comprising...