INTERNATIONAL PATENT: ENDRESS+HAUSER WETZER GMBH+CO. KG FILES APPLICATION FOR "METHOD FOR CHARACTERISING A MEASURING POINT AND FOR OPTIMISING THE CORRESPONDING MEASURING POINT"

GENEVA, Jan. 5 -- ENDRESS+HAUSER WETZER GMBH+CO. KG (Obere Wank 187484 Nesselwang) filed a patent application (PCT/EP2025/065793) for "METHOD FOR CHARACTERISING A MEASURING POINT AND FOR OPTIMISING THE CORRESPONDING MEASURING POINT" on Jun 06, 2025. With publication no. WO/2026/002590, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KUSS, Florian (RomerstraBe 3787437 Kempten)

Abstract: The invention relates to a method for characterising a measuring point (100), wherein measurement values (MW) detected by a first measuri...