INTERNATIONAL PATENT: DOW GLOBAL TECHNOLOGIES LLC FILES APPLICATION FOR "PH MEASUREMENT SYSTEM AND METHOD"

GENEVA, Aug. 26 -- DOW GLOBAL TECHNOLOGIES LLC (2211 H.H. Dow WayMidland, Michigan 48674) filed a patent application (PCT/US2025/015248) for "pH MEASUREMENT SYSTEM AND METHOD" on Feb 10, 2025. With publication no. WO/2025/174696, the details related to the patent application was published on Aug 21, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DEO, Puspendu (230 Abner Jackson PkwyLake Jackson, Texas 77566), BARTLETT, Wenzel P. (230 Abner Jackson PkwyLake Jackson, Texas 77566), LEE, Max M. (2301 N. Brazosport BlvdFreeport, Texas 77541), FINLEY, Timothy D. (2301 N. Brazosport BlvdFreeport, ...