INTERNATIONAL PATENT: DELTA DIAGNOSTICS B.V. FILES APPLICATION FOR "INSTRUMENT AND METHOD FOR INTERROGATING DIFFERENT TYPES OF OPTICAL CHIPS"

GENEVA, Nov. 18 -- DELTA DIAGNOSTICS B.V. (Marconistraat 163029 AK Rotterdam) filed a patent application (PCT/NL2025/050218) for "INSTRUMENT AND METHOD FOR INTERROGATING DIFFERENT TYPES OF OPTICAL CHIPS" on May 07, 2025. With publication no. WO/2025/234879, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DE BOER, Bart Michiel (c/o Marconistraat 163029 AK Rotterdam)

Abstract: An instrument (10) and method for interrogating an optical chip (20). A chip holder (15) is configured to hold the optical chip (20). A light source...