INTERNATIONAL PATENT: DEERE & COMPANY FILES APPLICATION FOR "TRIPLE FREQUENCY SATELLITE BIAS DETERMINATION FOR A GLOBAL SATELLITE CORRECTION SIGNAL"

GENEVA, Jan. 20 -- DEERE & COMPANY (One John Deere PlaceMoline, Illinois 61265) filed a patent application (PCT/US2025/036388) for "TRIPLE FREQUENCY SATELLITE BIAS DETERMINATION FOR A GLOBAL SATELLITE CORRECTION SIGNAL" on Jul 03, 2025. With publication no. WO/2026/015370, the details related to the patent application was published on Jan 15, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DAI, Liwen (20780 Madrona Avenue, Building ATorrance, California 90503), CHEN, Yiqun (20780 Madrona Avenue, Building ATorrance, California 90503)

Abstract: The precise point positioning module or the esti...