INTERNATIONAL PATENT: DEEP LIGHT VISION AB FILES APPLICATION FOR "SYSTEM AND METHOD FOR LOCALISING AND MEASURING LIGHT IN LIGHT-SCATTERING MEDIA"

GENEVA, Sept. 29 -- DEEP LIGHT VISION AB (Gasverksgatan 1222 29 Lund) filed a patent application (PCT/EP2025/057727) for "SYSTEM AND METHOD FOR LOCALISING AND MEASURING LIGHT IN LIGHT-SCATTERING MEDIA" on Mar 20, 2025. With publication no. WO/2025/196237, the details related to the patent application was published on Sep 25, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KINOS, Adam (Banmastargarden 6245 63 Hjarup), RIPPE, Lars (Bardisangranden 32226 48 Lund), KROLL, Stefan (Lunnarp 301247 94 Dalby)

Abstract: A system for light measurements in a subject, the system comprising at least one ...