GENEVA, May 12 -- DASARI, Ganeshram (33A Panchaliamman Koil Street Arumbakkam TamilnaduChennai 600106) filed a patent application (PCT/IB2024/060559) for "A SYSTEM AND METHOD FOR MEASURING FLATNESS AND WARPAGE OF A SURFACE" on Oct 26, 2024. With publication no. WO/2025/094014, the details related to the patent application was published on May 08, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): DASARI, Ganeshram (33A Panchaliamman Koil Street Arumbakkam TamilnaduChennai 600106)
Abstract:
The present invention describes a novel system (100) and method for measuring the flatness and warpage ...