INTERNATIONAL PATENT: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA FILES APPLICATION FOR "METHOD, SYSTEM AND COMPUTER PROGRAM FOR DETERMINING A PARAMETER OF A PUPIL"

GENEVA, Nov. 10 -- CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA (Rue Jaquet-Droz 12000 Neuchatel) filed a patent application (PCT/EP2025/061963) for "METHOD, SYSTEM AND COMPUTER PROGRAM FOR DETERMINING A PARAMETER OF A PUPIL" on Apr 30, 2025. With publication no. WO/2025/229125, the details related to the patent application was published on Nov 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TURETKEN, Engin (c/oCSEM Centre Suisse d'Electronique et de Microtechnique SARue Jaquet-Droz 12000 Neuchatel), SAEEDI, Sareh (c/oCSEM Centre Suisse d'Electronique et de Microtechnique SA...